Toggle Main Menu Toggle Search

Open Access padlockePrints

Quantifying self-heating effects in strained Si MOSFETs with scaling

Lookup NU author(s): Rouzet Agaiby, Yang Yang, Dr Sarah Olsen, Professor Anthony O'Neill


Full text for this publication is not currently held within this repository. Alternative links are provided below where available.

Publication metadata

Author(s): Agaiby R, Yang Y, Olsen SH, O'Neill AG, Eneman G, Verheyen P, Loo R, Claeys C

Publication type: Article

Publication status: Published

Journal: Solid-State Electronics

Year: 2007

Volume: 51

Issue: 11-12

Pages: 1473-1478

ISSN (print): 0038-1101

ISSN (electronic): 1879-2405

Publisher: Pergamon


DOI: 10.1016/j.sse.2007.09.012


Altmetrics provided by Altmetric


Find at Newcastle University icon    Link to this publication