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Quantifying self-heating effects in strained Si MOSFETs with scaling

Lookup NU author(s): Rouzet Agaiby, Yang Yang, Dr Sarah Olsen, Professor Anthony O'Neill

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Publication metadata

Author(s): Agaiby R, Yang Y, Olsen SH, O'Neill AG, Eneman G, Verheyen P, Loo R, Claeys C

Publication type: Article

Publication status: Published

Journal: Solid-State Electronics

Year: 2007

Volume: 51

Issue: 11-12

Pages: 1473-1478

ISSN (print): 0038-1101

ISSN (electronic): 1879-2405

Publisher: Pergamon

URL: http://dx.doi.org/10.1016/j.sse.2007.09.012

DOI: 10.1016/j.sse.2007.09.012


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