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Prediction of boron transient enhanced diffusion through the atom-by-atom modeling of extended defects

Lookup NU author(s): Professor Nick Cowern

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Author(s): Cowern NEB; Lampin E; Cristiano F; Lamrani Y; Claverie A; Colombeau B

Publication type: Article

Publication status: Published

Journal: Journal of Applied Physics

Year: 2003

Volume: 94

Issue: 12

Pages: 7520-7525

ISSN (print): 0021-8979

ISSN (electronic): 1089-7550

Publisher: American Institute of Physics

URL: http://dx.doi.org/10.1063/1.1627461

DOI: 10.1063/1.1627461

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