Browse by author
Lookup NU author(s): Dr Basel Halak,
Professor Alex Yakovlev
Full text for this publication is not currently held within this repository. Alternative links are provided below where available.
The impact of crosstalk noise on the resilience of on-chip communication links in the presence of parametric variations is investigated. A novel metric called crosstalk error rate is developed which can be a valuable tool for designers to predict the crosstalk effects and explore interconnect design techniques in order to achieve the target performance with minimum overheads. Closed-form expressions of crosstalk error rate are presented. This metric is used to compare different crosstalk avoidance methods in the 90 nm technology.
Author(s): Halak B, Yakovlev A
Publication type: Article
Publication status: Published
Journal: IET Computers and Digital Techniques
Print publication date: 01/03/2011
ISSN (print): 1751-8601
ISSN (electronic): 1751-861X
Publisher: The Institution of Engineering and Technology
Altmetrics provided by Altmetric