Lookup NU author(s): Dr Basel Halak,
Professor Alex Yakovlev
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The impact of crosstalk noise on the resilience of on-chip communication links in the presence of parametric variations is investigated. A novel metric called crosstalk error rate is developed which can be a valuable tool for designers to predict the crosstalk effects and explore interconnect design techniques in order to achieve the target performance with minimum overheads. Closed-form expressions of crosstalk error rate are presented. This metric is used to compare different crosstalk avoidance methods in the 90 nm technology.
Author(s): Halak B, Yakovlev A
Publication type: Article
Publication status: Published
Journal: IET Computers and Digital Techniques
Print publication date: 01/03/2011
ISSN (print): 1751-8601
ISSN (electronic): 1751-861X
Publisher: The Institution of Engineering and Technology
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