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The Ab Initio Cluster Method and the Dynamics of Defects in Semiconductors

Lookup NU author(s): Professor Patrick Briddon

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Publication metadata

Author(s): Jones R, Briddon P

Editor(s): Michael Stavola

Publication type: Book Chapter

Publication status: Published

Book Title: Identification of Defects in Semiconductors

Year: 1998

Volume: 51

Pages: 287-349

Print publication date: 01/01/1998

Series Title: Semiconductors and Semimetals

Publisher: Academic Press

Place Published: London

URL: http://dx.doi.org/10.1016/S0080-8784(08)63058-6

DOI: 10.1016/S0080-8784(08)63058-6

Notes: Chapter 6

Library holdings: Search Newcastle University Library for this item

ISBN: 9780127521596


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