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A Synchronizer Design Based on Wagging

Lookup NU author(s): Mohammed Alshaikh, Professor David Kinniment, Professor Alex Yakovlev

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Abstract

The reliability of a synchronizer depends on its recovery time from metastability, a time which is reduced if the delay through the synchronizer flip flops is large. The D to Q delay in a dual edge triggered D flip flop based on wagging is lower than in other designs allowing more time for metastability recovery. We also apply wagging to the synchronizer itself, reducing its delay even more when compared with conventional cascaded two flip-flops single clock cycle synchronizer, hence increasing the time available for recovery from metastability, and improving its latency. This advantage is greater in multiple cycle synchronizers.


Publication metadata

Author(s): Alshaikh M, Kinniment D, Yakovlev A

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: International Conference on Microelectronics (ICM)

Year of Conference: 2010

Pages: 415-418

Publisher: IEEE

URL: http://dx.doi.org/10.1109/ICM.2010.5696176

DOI: 10.1109/ICM.2010.5696176

Library holdings: Search Newcastle University Library for this item

ISBN: 9781612841496


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