Toggle Main Menu Toggle Search

Open Access padlockePrints

Impact of Ge diffusion and wafer cross hatching on strained Si MOSFET electrical parameters

Lookup NU author(s): Luke Driscoll, Dr Sarah Olsen, Dr Sanatan Chattopadhyay, Professor Anthony O'Neill, Dr Kelvin Kwa, Dr Piotr Dobrosz, Professor Steve Bull


Full text for this publication is not currently held within this repository. Alternative links are provided below where available.

Publication metadata

Author(s): Driscoll L, Olsen S, Chattopadhyay S, O'Neill A, Kwa K, Dobrosz P, Bull S

Editor(s): Caymax, M., Rim, K., Zaima, S., Kasper, E., Fichtner, P.F.P.

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: High-Mobility Group IV Materials and Devices

Year of Conference: 2004

Pages: 225-230

ISSN: 0272-9172

Publisher: Materials Research Society

Library holdings: Search Newcastle University Library for this item

ISBN: 9781558997592


Find at Newcastle University icon    Link to this publication