Lookup NU author(s): Dr Gordon Russell,
Dr Frank Burns,
Professor Alex Yakovlev
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Process parameter variability in IC manufacturing has become an increasingly important issue as feature scaling descends further into the deep submicron region. Within industry the development of EDA tools associated with 'process-aware-design' has a high priority as the impact on circuit performance due to process variations is having increasingly adverse effects on yield and performance. VARMA is a variability analysis tool which enables optimisation of both manufacturing process and nano-electronic circuit design in order to avoid 'manufacturing surprises' resulting in costly chip respins, delays in reaching the market place and the subsequent loss of profitability.
Author(s): Russell G, Burns F, Yakovlev A
Publication type: Conference Proceedings (inc. Abstract)
Publication status: Published
Conference Name: 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
Year of Conference: 2012
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