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Low Frequency Noise Analysis of Monolithically Fabricated 4H-SiC CMOS Field Effect Transistors

Lookup NU author(s): Lucy Martin, Dr Hua Khee Chan, Dr Jon Goss, Professor Nick Wright, Dr Alton Horsfall

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Author(s): Martin LC, Chan HK, Clark D, Ramsay EP, Murphy AE, Smith DA, Thompson RF, Young RAR, Goss JP, Wright NG, Horsfall AB

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: 15th International Conference on Silicon Carbide and Related Materials (ICSCRM 2013)

Year of Conference: 2014

Pages: 428-431

ISSN: 0255-5476

Publisher: Scientific.Net

URL: http://dx.doi.org/10.4028/www.scientific.net/MSF.778-780.428

DOI: 10.4028/www.scientific.net/MSF.778-780.428

Library holdings: Search Newcastle University Library for this item

Series Title: Materials Science Forum: Silicon Carbide and Related Materials 2013

ISBN: 9783038350101


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