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Lifetime Reliability Characterization of N/MEMS Used in Power Gating of Digital Integrated Circuits

Lookup NU author(s): Sam Alrudainy, Dr Rishad Shafik, Dr Andrey Mokhov, Professor Alex Yakovlev

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Author(s): Alrudainy H, Shafik R, Mokhov A, Yakovlev A

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

Year of Conference: 2018

Online publication date: 04/01/2018

Acceptance date: 04/07/2017

ISSN: 2377-7966

Publisher: IEEE

URL: https://doi.org/10.1109/DFT.2017.8244452

DOI: 10.1109/DFT.2017.8244452

Library holdings: Search Newcastle University Library for this item

ISBN: 9781538603628


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