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Tight Upper Bound Performance of Full-Duplex MIMO-BICM-IDD Systems in the Presence of Residual Self-interference

Lookup NU author(s): Mohamad Ahmed, Dr Charalampos Tsimenidis

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This work is licensed under a Creative Commons Attribution 4.0 International License (CC BY 4.0).


Abstract

In this paper, we derive a tight upper bound on the performance of a coded full-duplex (FD) multiple-input multiple-output (MIMO) based bidirectional transceiver. Iterative detection and decoding (IDD)are proposed to suppress the residual self-interference (SI) remaining after applying different stages ofSI cancellation (SIC). IDD comprises an adaptive minimum mean-squared error (MMSE) filter withlog-likelihood ratio (LLR) demapping, while the soft decoder by using soft-in soft-out decoding utilizesthe maximum a posteriori (MAP) algorithm. Furthermore, bit-interleaved coded modulation (BICM)is considered in the presence of additive white Gaussian noise (AWGN) over MIMO frequency non-selective Rayleigh fading channels. Simulation results are presented to demonstrate the bit-error rate(BER) performance as a function of the signal-to-noise ratio (SNR) showing a close match to the SI-free case for the proposed system. Furthermore, we validate our results by deriving a tight upper boundon the performance of the proposed system using rate-1/2 convolutional codes together with M -aryquadrature amplitude modulation (QAM), which asymptotically exhibits a close agreement with thesimulated BER performance. Moreover, extrinsic information transfer (EXIT) chart analysis is used toinvestigate the convergence behaviour of the proposed IDD receiver and to determine the number ofiterations required for this convergence.


Publication metadata

Author(s): Ahmed MA, Tsimenidis CC

Publication type: Article

Publication status: Published

Journal: IEEE Transactions on Wireless Communications

Year: 2017

Volume: 17

Issue: 1

Pages: 520-532

Print publication date: 01/01/2018

Online publication date: 03/11/2017

Acceptance date: 24/10/2017

ISSN (print): 1536-1276

ISSN (electronic): 1558-2248

Publisher: IEEE

URL: https://doi.org/10.1109/TWC.2017.2768027

DOI: 10.1109/TWC.2017.2768027

Data Source Location: http://dx.doi.org/10.17634/150074-2


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