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Lookup NU author(s): Dr Rishad Shafik

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Author(s): Shafik R, Yu Q, Khursheed S, Miele A

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: 2017 IEEE Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017

Year of Conference: 2018

Pages: iii-

Online publication date: 04/01/2018

Acceptance date: 23/10/2017

Publisher: Institute of Electrical and Electronics Engineers Inc.

URL: https://doi.org/10.1109/DFT.2017.8244425

DOI: 10.1109/DFT.2017.8244425

Library holdings: Search Newcastle University Library for this item

ISBN: 9781538603628


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