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Lookup NU author(s): Dr Rishad Shafik
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Author(s): Shafik R, Yu Q, Khursheed S, Miele A
Publication type: Conference Proceedings (inc. Abstract)
Publication status: Published
Conference Name: 2017 IEEE Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017
Year of Conference: 2018
Pages: iii-
Online publication date: 04/01/2018
Acceptance date: 23/10/2017
Publisher: Institute of Electrical and Electronics Engineers Inc.
URL: https://doi.org/10.1109/DFT.2017.8244425
DOI: 10.1109/DFT.2017.8244425
Library holdings: Search Newcastle University Library for this item
ISBN: 9781538603628
