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Mode specific backscattering in a quantum point contact

Lookup NU author(s): Dr Aleksey KozikovORCiD

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Abstract

We demonstrate a scanning gate grid measurement technique consisting in measuring the conductance of a quantum point contact (QPC) as a function of gate voltage at each tip position. Unlike conventional scanning gate experiments, it allows investigating QPC conductance plateaus affected by the tip at these positions. We compensate the capacitive coupling of the tip to the QPC and discover that interference fringes coexist with distorted QPC plateaus. We spatially resolve the mode structure for each plateau.

Publication metadata

Author(s): Kozikov AA, Steinacher R, Rössler C, Ihn T, Ensslin K, Reichl C, Wegscheider W

Publication type: Article

Publication status: Published

Journal: Nano Letters

Year: 2015

Volume: 15

Issue: 12

Pages: 7994-7999

Print publication date: 09/12/2015

Online publication date: 16/11/2015

Acceptance date: 10/11/2015

ISSN (print): 1530-6984

ISSN (electronic): 1530-6992

Publisher: American Chemical Society

URL: https://doi.org/10.1021/acs.nanolett.5b03170

DOI: 10.1021/acs.nanolett.5b03170

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