Composition measurement of epitaxial Sc<sub>x</sub>Ga<sub>1−x</sub>N films

Composition measurement of epitaxial Sc_xGa_1−xN films

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Author(s): Tsui HCL, Goff LE, Barradas NP, Alves E, Pereira S, Palgrave RG, Davies RJ, Beere HE, Farrer I, Ritchie DA, Moram MA

Publication type: Article

Publication status: Published

Journal: Semiconductor Science and Technology

Year: 2016

Volume: 31

Issue: 6

Online publication date: 19/05/2016

Acceptance date: 25/04/2016

ISSN (print): 0268-1242

ISSN (electronic): 1361-6641

Publisher: Institution of Physics

URL: https://doi.org/10.1088/0268-1242/31/6/064002

DOI: 10.1088/0268-1242/31/6/064002

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