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Indirect measurements of water content using TDR-inferred dielectric permittivity and electrical resistivity

Lookup NU author(s): Dr Bruna LopesORCiD

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This work is licensed under a Creative Commons Attribution 4.0 International License (CC BY 4.0).


Abstract

The measurement of moisture distribution in Engineered Barrier Systems (EBS) in salt mines and deep geological disposals is essential in order to monitor fluid ingress and record data for long-term security analyses. Additionally, soil moisture content has influence over the mechanical properties of the soil as well as plant growth, soil stability and contaminant transport to cite some. Therefore, finding affordable and reliable ways to determine moisture content, quickly and in the field without sampling, is of great interested among people in different subject areas. Time-domain reflectometry (TDR) has become a recognized electromagnetic method for non-destructive measurement of dielectric permittivity and electrical conductivity of moist porous materials. It turns out that both these measurements depend on the material moisture content, among other things. This paper presents a series of calibration tests performed on soil samples. TDR probes were used to obtain the dielectric permittivity and electrical conductivity of the samples. As a consequence, relationships between these measurements and the samples' volumetric water content were later established. These relationships can then be used to indirectly determine that important information of water content on similar soil material using cheap, quick and non-destructive TDR probes.


Publication metadata

Author(s): Lopes BCFL, Lopes LCFL, Tarantino A

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: 7th International Symposium on Deformation Characteristics of Geomaterials

Year of Conference: 2019

Online publication date: 25/06/2019

Acceptance date: 01/04/2019

Date deposited: 19/08/2022

ISSN: 2267-1242

Publisher: EDP Sciences

URL: https://doi.org/10.1051/e3sconf/20199202005

DOI: 10.1051/e3sconf/20199202005


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