Using device figure of merit to optimize transistor selection based on switching and conduction loss over a wide temperature range

Full text for this publication is not currently held within this repository. Alternative links are provided below where available.

Author(s): Galea G, Pickert V, Gibson RS, Armstrong M

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: 11th International Conference on Power Electronics, Machines and Drives (PEMD 2022)

Year of Conference: 2022

Online publication date: 29/08/2022

Acceptance date: 21/06/2022

Publisher: IET

URL: https://doi.org/10.1049/icp.2022.1105

DOI: 10.1049/icp.2022.1105

Library holdings: Search Newcastle University Library for this item

ISBN: 9781839537189

ePrints