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Experimental Determination of Electron Drift Velocity in 4H-SiC p+-n-n+ Avalanche Diodes

Lookup NU author(s): Dr Konstantin VasilevskiyORCiD

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Author(s): Vassilevski KV; Zekentes K; Zorenko AV; Romanov LP

Publication type: Article

Publication status: Published

Journal: IEEE Electron Device Letters

Year: 2000

Volume: 21

Issue: 10

Pages: 485-487

ISSN (print): 0741-3106

ISSN (electronic): 1558-0563

Publisher: Institution of Electronic and Electrical Engineers

URL: http://dx.doi.org/10.1109/55.870609

DOI: 10.1109/55.870609

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