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An investigation of the structural and thermal transfer characteristics of commercial power mosfet devices using experimental and modelling techniques

Lookup NU author(s): Dr Len Pritchard, Dr Christopher Johnson, Professor Paul Acarnley, Dr Alton Horsfall

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Abstract

This paper presents the results of an investigation into the structural and electrothermal properties of a group of commercial power MOSFET devices. Variations between devices of the same type designation were examined using electrothermal measurements, microscopic analysis and mathematical simulation techniques. Transient electrical measurements demonstrate significant differences in the semiconductor die temperature, supported by observed variations in structure and thermal modelling results.

Publication metadata

Author(s): Acarnley PP; Pritchard LS; Horsfall AB; Johnson CM

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: International Conference on Power Electronics, Machines and Drives

Year of Conference: 2002

Pages: 562-567

ISSN: 0537-9989

Publisher: IEEE

URL: http://dx.doi.org/10.1049/cp:20020178

DOI: 10.1049/cp:20020178

Library holdings: Search Newcastle University Library for this item

ISBN: 0852967470

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