Toggle Main Menu Toggle Search

Open Access padlockePrints

A model for capacitance reconstruction from measured lossy MOS capacitance-voltage characteristics

Lookup NU author(s): Dr Kelvin Kwa, Dr Sanatan Chattopadhyay, Dr Nebojsa Jankovic Professor, Dr Sarah Olsen, Luke Driscoll, Professor Anthony O'Neill


Full text for this publication is not currently held within this repository. Alternative links are provided below where available.

Publication metadata

Author(s): Kwa KSK, Chattopadhyay S, Jankovic ND, Olsen SH, Driscoll LS, O'Neill AG

Publication type: Article

Publication status: Published

Journal: Semiconductor Science and Technology

Year: 2003

Volume: 18

Issue: 2

Pages: 82-87

Print publication date: 01/02/2003

ISSN (print): 0268-1242

ISSN (electronic): 1361-6641

Publisher: Institute of Physics Publishing Ltd.


DOI: 10.1088/0268-1242/18/2/303


Altmetrics provided by Altmetric


Find at Newcastle University icon    Link to this publication