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A model for capacitance reconstruction from measured lossy MOS capacitance-voltage characteristics

Lookup NU author(s): Dr Kelvin Kwa, Dr Sanatan Chattopadhyay, Dr Nebojsa Jankovic Professor, Dr Sarah Olsen, Luke Driscoll, Professor Anthony O'Neill

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Publication metadata

Author(s): Kwa KSK, Chattopadhyay S, Jankovic ND, Olsen SH, Driscoll LS, O'Neill AG

Publication type: Article

Publication status: Published

Journal: Semiconductor Science and Technology

Year: 2003

Volume: 18

Issue: 2

Pages: 82-87

Print publication date: 01/02/2003

ISSN (print): 0268-1242

ISSN (electronic): 1361-6641

Publisher: Institute of Physics Publishing Ltd.

URL: http://dx.doi.org/10.1088/0268-1242/18/2/303

DOI: 10.1088/0268-1242/18/2/303


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