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Design of sub-10-picoseconds on-chip time measurement circuit

Lookup NU author(s): Mohd Abas, Dr Gordon Russell, Professor David Kinniment

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Abstract

The rapid pace of change in IC technology, specifically in speed of operation, demands sophisticated design solutions for IC testing methodologies. Moreover, the current technology of system-on-chip (SOC) makes great demands for testing internal speed accurately as the limitation on accessing internal nodes using I/O pins becomes more difficult. This paper presents two high-resolution time measurement schemes for digital BIST applications, namely: two-delay interpolation method (TDIM) and time amplifier. The two schemes are combined to produce a completely new design for BIST time measurement which offers two main advantages: a low range of timing measurement which has never been achieved before, and a small size of layout occupying 0.2 mm/sup 2/ or equivalent to 3020 transistors. These two features are undoubtedly compatible with present high-speed SOC design architectures. (5 References).


Publication metadata

Author(s): Abas MA, Russell G, Kinniment DJ

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: Design, Automation and Test in Europe Conference and Exhibition. IEEE Comput. Soc. Part Vol.2, 2004

Year of Conference: 2004

Pages: 804-9 Vol

ISSN: 9780769520858

Publisher: IEEE Computer Society

URL: http://dx.doi.org/10.1109/DATE.2004.1268980

DOI: 10.1109/DATE.2004.1268980

Notes: Gielen G Figueras J 2. Los Alamitos, CA, USA. Proceedings. Design, Automation and Test in Europe Conference and Exhibition. Paris, France. EDAA, EDA Consortium, IEEE Comput. Soc. TTTC. IEEE Comput. Soc. DATC. ECSI. ACM/SIGDA. RAS. 16-20 Feb. 2004.

Library holdings: Search Newcastle University Library for this item

ISBN: 0769520855


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