Toggle Main Menu Toggle Search

Open Access padlockePrints

The use of Raman spectroscopy to identify strain and strain relaxation in strained Si/SiGe structures

Lookup NU author(s): Dr Piotr Dobrosz, Professor Steve Bull, Dr Sarah Olsen, Professor Anthony O'Neill

Downloads

Full text for this publication is not currently held within this repository. Alternative links are provided below where available.


Publication metadata

Author(s): Dobrosz P, Bull SJ, Olsen SH, O'Neill AG

Publication type: Article

Publication status: Published

Journal: Surface and Coatings Technology

Year: 2005

Volume: 200

Issue: 5-6

Pages: 1755-1760

ISSN (print): 0257-8972

ISSN (electronic):

Publisher: Elsevier

URL: http://dx.doi.org/10.1016/j.surfcoat.2005.08.048

DOI: 10.1016/j.surfcoat.2005.08.048


Altmetrics

Altmetrics provided by Altmetric


Actions

Find at Newcastle University icon    Link to this publication


Share