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The use of Raman spectroscopy to identify strain and strain relaxation in strained Si/SiGe structures

Lookup NU author(s): Dr Piotr Dobrosz, Professor Steve Bull, Dr Sarah Olsen, Professor Anthony O'Neill

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Publication metadata

Author(s): Dobrosz P, Bull SJ, Olsen SH, O'Neill AG

Publication type: Article

Publication status: Published

Journal: Surface and Coatings Technology

Year: 2005

Volume: 200

Issue: 5-6

Pages: 1755-1760

ISSN (print): 0257-8972

ISSN (electronic):

Publisher: Elsevier

URL: http://dx.doi.org/10.1016/j.surfcoat.2005.08.048

DOI: 10.1016/j.surfcoat.2005.08.048

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