Measurement of mechanical properties of thin films and nanostructured materials at high spatial resolution

Bull, SJ

doi:10.4028/www.scientific.net/MSF.539-543.3534

Measurement of mechanical properties of thin films and nanostructured materials at high spatial resolution

Lookup NU author(s): Professor Steve Bull ORCiD

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Abstract

The development of nanostructured materials and coatings has driven the development of indentation-based assessment techniques which aim to generate useful mechanical property information. This paper introduces an approach to determine the limits for which direct measurement of these properties are possible and highlights the importance of modelling if reliable data is to be obtained from very thin coatings (<200nm) and fine grained materials.