Lookup NU author(s): Dr Alexander Korsunsky,
Professor Brian Shaw
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Diffraction strain measurement techniques offer a unique analytical tool to the materials scientist and engineer, interested in the residual and live stresses in engineering materials and components. The present paper reviews the application of several experimental techniques to the study of internal stress development in an AI/SiC particulate composite. A comparison is made between using laboratory X-ray diffraction with a stress camera; synchrotron X-ray diffraction using a high resolution spectrometer, and a 2D detector; and neutron diffraction using a reactor, and a pulsed spallation source. The performance of various instruments is compared in terms of a semi-qualitative parameter describing time required for data collection. The capabilities and shortcomings of each method are highlighted. Possible ways of achieving complementarity of results from different instruments are discussed.
Author(s): Korsunsky AM, Wells KE, Shaw BA
Editor(s): Bottger, A.J., Delhez, R., Mittemeijer, E.J.
Publication type: Conference Proceedings (inc. Abstract)
Publication status: Published
Conference Name: ECRS 5: proceedings of the Fifth European Conference on Residual Stresses
Year of Conference: 1999
Publisher: Trans Tech Publications
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