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The electrical resistance of Ni/sub 50/Ti/sub 30/Hf/sub 20/ and Ni/sub 50/Ti/sub 40.5/Hf/sub 9.5/ melt-spun ribbons during current-driven thermal cycles

Lookup NU author(s): Dr Michele Pozzi

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Abstract

The electrical resistance of Ni/sub 50/Ti/sub 30/Hf/sub 20/ and Ni/sub 50/Ti/sub 40.5/Hf/sub 9.5/ alloys during stress assisted two way memory effect was investigated with the aim to deduce the relationship between electrical resistance and deformation across the transformation range. Results show an almost linear relationship although a crossing point between increasing and decreasing deformation may compromise the use of these alloys in actuators. (6 References). ISBN 0255-5476

Publication metadata

Author(s): Pozzi M; Airoldi G; Piredda S; Shelyakov AV

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: International Symposium and Exhibition on Shape Memory Materials (SMM)

Year of Conference: 1999

Pages: 135-138

Publisher: Trans Tech Publications Ltd

Notes: International Symposium and Exhibition on Shape Memory Materials (SMM '99). Kanazawa, Japan. 19-21 May 1999. Temperature 8.23E+02 K Temperature 2.73E+02 to 5.73E+02 K English Conference Paper

Library holdings: Search Newcastle University Library for this item

Series Title: Materials Science Forum

ISBN: 02555476

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