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Browsing publications by Christopher Wilson.

Newcastle AuthorsTitleYearFull text
Nathan Brockie
Christopher Wilson
Dr Alton Horsfall
Fabrication of test structures to monitor stress in SU-8 films used for MEMS applications2010
Christopher Wilson
Dr Alton Horsfall
Professor Anthony O'Neill
A NEMS-based sensor to monitor stress in deep sub-micron Cu/Low-k interconnects2009
Christopher Wilson
Professor Anthony O'Neill
Dr Alton Horsfall
Application of a Nano-Mechanical Sensor to Monitor Stress in Copper Damascene Interconnects2009
Christopher Wilson
Dr Alton Horsfall
Professor Anthony O'Neill
Demonstration of a Sub-micron Damascene Cu/Low-k Mechanical Sensor to Monitor Stress in BEOL Metallization2009
Christopher Wilson
Dr Alton Horsfall
Professor Anthony O'Neill
Synchrotron measurement of the effect of dielectric porosity and air gaps on the stress in advanced Cu/low-k interconnects2009
Christopher Wilson
Dr Alton Horsfall
Professor Anthony O'Neill
Synchrotron measurement of the effect of linewidth scaling on stress in advanced Cu/Low-k interconnects2009
Christopher Wilson
Time and temperature dependence of early stage stress-induced-voiding in Cu/low-k interconnects2009
Christopher Wilson
Dr Alton Horsfall
Professor Anthony O'Neill
Professor Nick Wright
Professor Steve Bull
et al.
Direct measurement of electromigration-induced stress in interconnect structures2007