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Browsing publications by Dr Suresh Uppal

Newcastle AuthorsTitleYearFull text
Dr Yuk Tsang
Dr Sanatan Chattopadhyay
Dr Suresh Uppal
Dr Enrique Escobedo-Cousin
Deepak Ramakrishnan
et al.		Modeling of the threshold voltage in strained Si/Si1-x Gex/S1-yGey(x ≥ y) CMOS architectures2007
Dr Suresh Uppal
Monte Carlo simulation of Boron implantation into (100) germanium2007
Dr Suresh Uppal
A study of boron implantation into high Ge content SiGe alloys2006
Professor Nick Cowern
Dr Suresh Uppal
Diffusion and activation of dopants in silicon and advanced silicon-based materials2006
John Varzgar
Dr Mehdi Kanoun
Dr Suresh Uppal
Dr Sanatan Chattopadhyay
Dr Sarah Olsen
et al.		Gate Oxide Reliability of Strained Si NMOS Devices Employing a Thin SiFe Strain Relaxed Buffer2006
John Varzgar
Dr Sanatan Chattopadhyay
Dr Suresh Uppal
Dr Sarah Olsen
Professor Anthony O'Neill
et al.		Gate oxide reliability of strained Si NMOS devices employing a thin SiGe strain-relaxed buffer2006
Dr Suresh Uppal
John Varzgar
Dr Sanatan Chattopadhyay
Dr Sarah Olsen
Professor Anthony O'Neill
et al.		Gate oxide reliability of strained Si/SiGe MOS: effect of Ge content variation2006
Dr Suresh Uppal
John Varzgar
Dr Mehdi Kanoun
Dr Sanatan Chattopadhyay
Dr Sarah Olsen
et al.		Gate Oxide Reliability on strained Si/SiGe MOS: Effect of Ge content variation2006
Dr Suresh Uppal
Dr Mehdi Kanoun
Dr Sanatan Chattopadhyay
Rimoon Agaiby
Dr Sarah Olsen
et al.		Ge out-diffusion and its effect on electrical properties in s-Si/SiGe devices2006
Dr Suresh Uppal
Dr Mehdi Kanoun
Dr Sanatan Chattopadhyay
Rouzet Agaiby
Dr Sarah Olsen
et al.		Ge out-diffusion and its effect on electrical properties in s-Si/SiGe devices2006
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