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Defect depth estimation using pulsed eddy current with varied pulse width excitation

Lookup NU author(s): Professor Gui Yun Tian, Yong Li

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Publication metadata

Author(s): Abidin IZ, Mandache C, Tian GY, Li Y

Publication type: Conference Proceedings (inc. Abstract)

Conference Name: Insight: Materials Testing 2008/NDT 2008 Conference

Year of Conference: 2009

Pages: 69-72

: 1354-2575

: 1754-4904

Publisher: British Institute of Non-Destructive Testing

URL: http://dx.doi.org/10.1784/insi.2009.51.2.69

DOI: 10.1784/insi.2009.51.2.69

Library holdings: Search Newcastle University Library for this item

ISBN: 17544904


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