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A C-element latch scheme with increased transient fault tolerance for asynchronous circuits

Lookup NU author(s): Kelvin Gardiner, Professor Alex Yakovlev, Dr Alex Bystrov

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Author(s): Gardiner KT, Yakovlev A, Bystrov A

Publication type: Conference Proceedings (inc. Abstract)

Conference Name: 13th IEEE International On-Line Testing Symposium Proceedings

Year of Conference: 2007

Pages: 223-228

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Publisher: IEEE Computer Society

Library holdings: Search Newcastle University Library for this item

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