Toggle Main Menu Toggle Search

ePrints

Defect identification in strained Si/SiGe heterolayers for device applications

Lookup NU author(s): Dr Enrique Escobedo-Cousin, Dr Sarah Olsen, Professor Anthony O'Neill

Downloads


Publication metadata

Author(s): Escobedo-Cousin E, Olsen SH, O'Neill AG, Coulson H

Publication type: Article

Journal: Journal of Physics D: Applied Physics

Year: 2009

Volume: 42

Issue: 17

Online publication date: 17/08/2009

Acceptance date: 23/07/2009

Print publication date: 01/09/2009

ISSN (print): 0022-3727

ISSN (electronic): 1361-6463

Publisher: Institute of Physics Publishing Ltd.

URL: http://dx.doi.org/10.1088/0022-3727/42/17/175306

DOI: 10.1088/0022-3727/42/17/175306


Altmetrics

Altmetrics provided by Altmetric


Actions

    Link to this publication


Share