Toggle Main Menu Toggle Search

ePrints

Randomized Radon Signature for face biometric verification

Lookup NU author(s): Mohammad Dabbah, Professor Satnam Dlay, Dr Wai Lok Woo

Downloads


Publication metadata

Author(s): Dabbah MA, Dlay SS, Woo WL

Publication type: Conference Proceedings (inc. Abstract)

Conference Name: 15th IEEE International Conference on Image Processing (ICIP 2008)

Year of Conference: 2008

Pages: 273-276

:

:

Publisher: IEEE

URL: http://dx.doi.org/10.1109/ICIP.2008.4711744

DOI: 10.1109/ICIP.2008.4711744

Library holdings: Search Newcastle University Library for this item

ISBN: 9781424417650


Actions

    Link to this publication


Share