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Investigation of directional eddy current complex measurements for defect mapping

Lookup NU author(s): Anthony Simm, Professor Gui Yun Tian

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Publication metadata

Author(s): Simm A, Tian GY

Publication type: Article

Journal: Insight

Year: 2010

Volume: 52

Issue: 6

Pages: 320-325

Print publication date: 01/06/2010

ISSN (print): 1354-2575

ISSN (electronic): 1754-4904

Publisher: British Institute of Non-Destructive Testing

URL: http://dx.doi.org/10.1784/insi.2010.52.6.320

DOI: 10.1784/insi.2010.52.6.320


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