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Nanoscale Characterization of Gate Leakage in Strained High-Mobility Devices

Lookup NU author(s): Raman Kapoor, Dr Enrique Escobedo-Cousin, Dr Sarah Olsen, Professor Steve Bull

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Publication metadata

Author(s): Kapoor R, Escobedo-Cousin E, Olsen SH, Bull SJ

Publication type: Article

Journal: IEEE Transactions on Electron Devices

Year: 2011

Volume: 58

Issue: 11

Pages: 4016-4023

Print publication date: 01/11/2011

ISSN (print): 0018-9383

ISSN (electronic):

Publisher: Institution of Electronic and Electrical Engineers

URL: http://dx.doi.org/10.1109/TED.2011.2164250

DOI: 10.1109/TED.2011.2164250


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