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Secure face biometric verification in the randomized Radon space

Lookup NU author(s): Mohammad Dabbah, Dr Wai Lok Woo, Professor Satnam Dlay

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Author(s): Dabbah MA, Woo WL, Dlay SS

Publication type: Conference Proceedings (inc. Abstract)

Conference Name: IEEE International Conference on Multimedia and Expo (ICME)

Year of Conference: 2008

Pages: 909-912

Publisher: IEEE

URL: http://dx.doi.org/10.1109/ICME.2008.4607583

DOI: 10.1109/ICME.2008.4607583

Library holdings: Search Newcastle University Library for this item

ISBN: 9781424425709


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