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One-way randomised Radon mapping for appearance-based biometric authentication

Lookup NU author(s): Mohammad Dabbah, Dr Wai Lok Woo, Professor Satnam Dlay

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Author(s): Dabbah MA, Woo WL, Dlay SS

Publication type: Conference Proceedings (inc. Abstract)

Conference Name: 5th International Conference on Visual Information Engineering (VIE 2008)

Year of Conference: 2008

Pages: 276-281

Publisher: Institution of Engineering and Technology (IET)

Library holdings: Search Newcastle University Library for this item

ISBN: 9780863419140


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