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Extending boundary-scan to perform a memory built-in self-test

Lookup NU author(s): Henning Bahr, Dr Gordon Russell, Dr Yajian Li

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Author(s): Bahr H, Russell G, Li Y

Publication type: Article

Journal: WSEAS Transactions on Electronics

Year: 2005

Volume: 2

Issue: 4

Pages: 161-165

ISSN (print): 1109-9445

ISSN (electronic):

Publisher: World Scientific and Engineering Academy and Society


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