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Analysis of gate leakage in strained Si MOSFETs

Lookup NU author(s): Dr Sarah Olsen, Dr Mehdi Kanoun, Mohamed Al-Areeki, Rimoon Agaiby, Goutan Dalapati, Professor Anthony O'Neill

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Publication metadata

Author(s): Yan L, Olsen SH, Kanoun M, Al-Araimi M, Agaiby R, Dalapati GK, O'Neill AG

Publication type: Conference Proceedings (inc. Abstract)

Conference Name: 210th Electrochemical Society Meeting

Year of Conference: 2006

Pages: 1001-1012

: 1938-5862

: 1938-6737

Publisher: ECS Transactions, Electrochemical Society, Inc.

URL: http://dx.doi.org/10.1149/1.2355894

DOI: 10.1149/1.2355894

Library holdings: Search Newcastle University Library for this item

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ISBN: 19386737


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