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Modeling of the threshold voltage in strained Si/Si1-x Gex/S1-yGey(x ≥ y) CMOS architectures

Lookup NU author(s): Dr Yuk Tsang, Dr Sanatan Chattopadhyay, Dr Suresh Uppal, Dr Enrique Escobedo-Cousin, Deepak Ramakrishnan, Dr Sarah Olsen, Professor Anthony O'Neill

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Author(s): Tsang YL, Chattopadhyay S, Uppal S, Escobedo-Cousin E, Ramakrishnan HK, Olsen SH, O'Neill AG

Publication type: Article

Journal: IEEE Transactions on Electron Devices

Year: 2007

Volume: 54

Issue: 11

Pages: 3040-3048

Print publication date: 01/11/2007

ISSN (print): 0018-9383

ISSN (electronic): 1557-9646

Publisher: IEEE

URL: http://dx.doi.org/10.1109/TED.2007.907190

DOI: 10.1109/TED.2007.907190


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