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Mode shape and failure analysis of high frequency MEMS/NEMS using Raman spectroscopy

Lookup NU author(s): Dr John Hedley, Dr Isabel Arce-Garcia, Dr Barry Gallacher

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Author(s): Hedley J, Hu Z, Arce-Garcia I, Gallacher BJ

Publication type: Conference Proceedings (inc. Abstract)

Conference Name: 3rd IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS

Year of Conference: 2008

Pages: 842-846

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Publisher: IEEE

URL: http://dx.doi.org/10.1109/NEMS.2008.4484455

DOI: 10.1109/NEMS.2008.4484455

Library holdings: Search Newcastle University Library for this item

ISBN: 9781424419081


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