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On-chip measurement of deep metastability in synchronizers

Lookup NU author(s): Jun Zhou, Professor David Kinniment, Dr Gordon Russell, Professor Alex Yakovlev

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Author(s): Zhou J, Kinniment DJ, Dike C, Russell G, Yakovlev A

Publication type: Article

Journal: IEEE Journal of Solid-State Circuits

Year: 2008

Volume: 43

Issue: 2

Pages: 550-557

Print publication date: 01/02/2008

ISSN (print): 0018-9200

ISSN (electronic): 1558-173X

Publisher: IEEE

URL: http://dx.doi.org/10.1109/JSSC.2007.913160

DOI: 10.1109/JSSC.2007.913160


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