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Analysing the Effect of Process Variation to Reduce Parametric Yield Loss

Lookup NU author(s): Santosh Shedabale, Dr Gordon Russell, Professor Alex Yakovlev

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Author(s): Ramakrishnan H, Shedabale S, Russell G, Yakovlev A

Publication type: Conference Proceedings (inc. Abstract)

Conference Name: IEEE International Conference on Integrated Circuit Design and Technology and Tutorial, ICICDT 2008

Year of Conference: 2008

Pages: 171-176

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Publisher: IEEE

URL: http://dx.doi.org/10.1109/ICICDT.2008.4567272

DOI: 10.1109/ICICDT.2008.4567272

Library holdings: Search Newcastle University Library for this item

ISBN: 9781424418114


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