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A High Resolution Flash Time-to-Digital Converter Taking Into Account Process Variability

Lookup NU author(s): Nikolaos Minas, Professor David Kinniment, Keith Heron, Dr Gordon Russell

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Abstract

Timing issues are a major concern in the design of high performance synchronous, asynchronous circuits and GALS. Investigations into the causes of many timing problems cannot be satisfactorily undertaken using external equipment due to its remoteness from the source of the potential problem; this necessitates the development of on-chip time measurement circuitry. Current techniques have the capability of resolving timing differences down to 5ps [ ], however further improvement is impeded by process variations. This paper describes a flash TDC Time to Digital Converter (TDC) suitable for on-chip implementation. The theory to overcome the effects of process variations, potentially permitting the time resolution down to one picosecond is described. Proof of concept is demonstrated by implementing the techniques in an FPGA, improving on the current resolution of FPGA implementation of a TDC.


Publication metadata

Author(s): Minas N, Kinniment D, Heron K, Russell G

Publication type: Conference Proceedings (inc. Abstract)

Conference Name: 13th IEEE International Symposium on Asynchronous Circuits and Systems, San Francisco, March 2007

Year of Conference: 2007

Pages: 163-174

Publisher: IEEE Computer Society

URL: http://dx.doi.org/10.1109/ASYNC.2007.7

DOI: 10.1109/ASYNC.2007.7

Library holdings: Search Newcastle University Library for this item

Series Editor(s): IEEE Computer Society

ISBN: 076952771X


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